K. A. S. Varun
Graduate Student at Cochin Univ of Science & Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 September 2007 Paper
Proceedings Volume 6671, 66710V (2007) https://doi.org/10.1117/12.733099
KEYWORDS: Speckle pattern, Speckle, Surface roughness, Surface finishing, Charge-coupled devices, Speckle metrology, Laser cutting, Light scattering, Collimation, Semiconductor lasers

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