Dr. Javier Vargas
at McGill Univ
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 21 August 2020 Presentation + Paper
Proceedings Volume 11490, 1149003 (2020) https://doi.org/10.1117/12.2568580
KEYWORDS: Principal component analysis, Phase shifts, Demodulation, Interferometry, Fringe analysis

Proceedings Article | 3 September 2019 Presentation + Paper
Proceedings Volume 11102, 111020M (2019) https://doi.org/10.1117/12.2530125
KEYWORDS: Principal component analysis, Phase shifts, Phase interferometry, Linear algebra, Numerical analysis, Fringe analysis, Phase retrieval

Proceedings Article | 7 October 2011 Paper
N. Uribe-Patarroyo, A. Alvarez-Herrero, P. García Parejo, J. Vargas, R. Heredero, R. Restrepo, V. Martínez Pillet, J. del Toro Iniesta, A. López, S. Fineschi, G. Capobianco, M. Georges, M. López, G. Boer, I. Manolis
Proceedings Volume 8148, 814810 (2011) https://doi.org/10.1117/12.904919
KEYWORDS: Polarimetry, Ultraviolet radiation, Wave plates, Aerospace engineering, Manufacturing, Liquid crystals, Coronagraphy, Radiation effects, Polarization, Birefringence

Proceedings Article | 10 September 2011 Paper
A. Alvarez-Herrero, N. Uribe-Patarroyo, P. García Parejo, J. Vargas, R. Heredero, R. Restrepo, V. Martínez-Pillet, J. C. del Toro Iniesta, A. López, S. Fineschi, G. Capobianco, M. Georges, M. López, G. Boer, I. Manolis
Proceedings Volume 8160, 81600Y (2011) https://doi.org/10.1117/12.892732
KEYWORDS: Liquid crystals, Polarimetry, Polarization, Ultraviolet radiation, Tolerancing, Glasses, Molecules, Birefringence, Modulation, Wavefronts

Proceedings Article | 3 October 2008 Paper
Proceedings Volume 7155, 71550H (2008) https://doi.org/10.1117/12.814516
KEYWORDS: Cameras, Projection systems, Defect inspection, Imaging systems, Calibration, Phase measurement, 3D metrology, Inspection, 3D modeling, Composites

SPIE Journal Paper | 1 May 2008
OE, Vol. 47, Issue 05, 053602, (May 2008) https://doi.org/10.1117/12.10.1117/1.2919726
KEYWORDS: Cameras, Calibration, 3D metrology, Phase measurement, Projection systems, 3D image processing, Imaging systems, 3D modeling, Picosecond phenomena, Optical engineering

SPIE Journal Paper | 1 February 2008
OE, Vol. 47, Issue 02, 023601, (February 2008) https://doi.org/10.1117/12.10.1117/1.2857404
KEYWORDS: Cameras, Projection systems, Phase measurement, Calibration, Imaging systems, 3D metrology, Optical engineering, Error analysis, Composites, Structured light

SPIE Journal Paper | 1 February 2007
Javier Vargas, Juan Antonio Quiroga, M. Jose Terron-Lopez
OE, Vol. 46, Issue 02, 023601, (February 2007) https://doi.org/10.1117/12.10.1117/1.2709855
KEYWORDS: Calibration, Cameras, Projection systems, Imaging systems, Distortion, 3D metrology, Optical engineering, Model-based design, 3D modeling, Data modeling

SPIE Journal Paper | 1 October 2006
OE, Vol. 45, Issue 10, 107203, (October 2006) https://doi.org/10.1117/12.10.1117/1.2361272
KEYWORDS: 3D metrology, Binary data, RGB color model, 3D modeling, 3D image processing, Optical engineering, Projection systems, Cameras, Spatial resolution, Structured light

Showing 5 of 9 publications
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