Jason E. Tiffany
at Johns Hopkins Univ Applied Physics Lab LLC
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 24 June 2014 Paper
Jason Tiffany, F. Christophe Brown, Kyle Manning, William Kellermeyer, Don King, David Drewry
Proceedings Volume 9070, 90701Q (2014) https://doi.org/10.1117/12.2050632
KEYWORDS: Cameras, Imaging systems, Modulation transfer functions, Long wavelength infrared, Silicon, Connectors, Spatial frequencies, Microbolometers, Quarks, Sensors

Proceedings Article | 8 May 2012 Paper
John Thomas, Matthew Shanaman, Christian Lomicka, Mike Boyle, Xiomara Calderon-Colon, Erin LaBarre, Jason Tiffany, Morgan Trexler
Proceedings Volume 8373, 83731S (2012) https://doi.org/10.1117/12.919395
KEYWORDS: Polymers, Carbon, Composites, Optical spheres, Performance modeling, Molecular interactions, Chemical species, Molecular electronics, Astatine, Applied physics

Proceedings Article | 3 May 2012 Paper
Keith Rebello, Jeffrey Maranchi, Jason Tiffany, Christopher Brown, Adam Maisano, Matthew Hagedon, Jason Heikenfeld
Proceedings Volume 8373, 83731A (2012) https://doi.org/10.1117/12.919555
KEYWORDS: Skin, Systems engineering, Electrodes, Microfluidics, Reflectivity, Computing systems, Epoxies, Computer engineering, Light sources and illumination, Reflective displays

Proceedings Article | 5 April 2007 Paper
Shahzad Ali, Linda Chen, Jason Tiffany, Anurag Yadav, Bryan Swain, David Dixon, Stephen Lickteig
Proceedings Volume 6518, 65182Q (2007) https://doi.org/10.1117/12.712085
KEYWORDS: Scatterometry, Metrology, Photoresist processing, Manufacturing, Lithography, Semiconducting wafers, Critical dimension metrology, Control systems, Environmental sensing, Time metrology

Proceedings Article | 28 May 2004 Paper
Proceedings Volume 5377, (2004) https://doi.org/10.1117/12.534267
KEYWORDS: Semiconducting wafers, Critical dimension metrology, Sensors, Temperature metrology, Time metrology, Photoresist processing, Process control, Data modeling, Thermal modeling, Infrared sensors

Showing 5 of 8 publications
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