Thin films with chiral or helical microstructures exhibit circular birefringence effects. Glancing angle deposition (GLAD) is a fabrication method capable of producing chiral thin films with controllable porosity and microstructure. In this paper, the effects of porosity on the circular birefringence exhibited by helical TiO2 films are presented. Transmittance measurements reveal two optimal film growth angles: one corresponding to a maximum in form birefringence and another corresponding to strong anisotropic scattering. Reflectance data support the transmittance measurements in the regime where scattering is minimized.
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