Dr. Jan Dolensky Profile

Dr. Jan Dolensky

at Brno Univ of Technology

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Proceedings Article | 20 August 2009 Paper

Diagnostic methods of solar cells in dependence on temperature

J. Dolensky, A. Vesely, J. Vanek, J. Hrozek

Proceedings Volume 7412, 74120U (2009) https://doi.org/10.1117/12.826135

KEYWORDS: Solar cells, Electroluminescence, CCD cameras, Temperature metrology, Diagnostics, Silicon, Diodes, Cameras, Infrared cameras, Testing and analysis

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This study is focused on testing methods determining quality of solar cells. Nowadays the development of solar cells is much faster and there is still necessary to increase their quality by removing causes of materials defects and also defects in a process of their production. Non-destructive methods are used for correct determination of defects by using of recombination effect of charge carrier in PN junction. Due to these methods can be the solar cell diagnosed and described. By using of various temperatures during the testing we can receive more objective results thanks to simulated operation conditions. Peltier cells are used for graditional change of temperature. Cooling system with liquid nitro - LN2 is used to reach the very low temperature. Diagnostic and testing methods described in this study are based on emission of light and the recombination processes in PN junction. It is especially electroluminescence and photoluminescence method. For comparison it is used the observation of emitted light from microplasma method. Described methods detect materials and process defects due to use of lownoise and very sensitive CCD camera.

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