Dr. James G. Shelnut
at Rohm and Haas Electronic Materials, LLC
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 11 March 2005 Paper
Matthew Moynihan, Bruno Sicard, Tuan Ho, Luke Little, Nick Pugliano, James Shelnut, Hai Bin Zheng, Phil Knudsen, Dan Lundy, Nancy Chiarotto, Curtis Lustig, Craig Allen
Proceedings Volume 5731, (2005) https://doi.org/10.1117/12.594675
KEYWORDS: Waveguides, Silicon, Optical interconnects, Copper, Signal attenuation, Polymers, Optics manufacturing, Reliability, Epoxies, Lithography

Proceedings Article | 10 June 2004 Paper
Nick Pugliano, Nancy Chiarroto, John Fisher, Noel Heiks, Tuan Ho, Garo Khanarian, Matthew Moynihan, Nathan Pawlowski, Jim Shelnut, David Sherrer, Bruno Sicard, Hai-Bin Zheng
Proceedings Volume 5358, (2004) https://doi.org/10.1117/12.526879
KEYWORDS: Waveguides, Optics manufacturing, Polymers, Integrated optics, Manufacturing, Plating, Connectors, Silicon, Metals, Data integration

Proceedings Article | 10 November 2003 Paper
Garo Khanarian, Yujian You, R. Gore, M. Talley, S. Ibbitson, A. Lamola, M. Gallagher, Bruno Sicard, Matthew Moynihan, James Shelnut
Proceedings Volume 5212, (2003) https://doi.org/10.1117/12.514841
KEYWORDS: Waveguides, Refractive index, Scattering, Cladding, Rayleigh scattering, Light scattering, Particles, Interfaces, Silicon, Semiconducting wafers

Proceedings Article | 10 November 2003 Paper
Matthew Moynihan, Craig Allen, Tuan Ho, Luke Little, Nathan Pawlowski, Nick Pugliano, James Shelnut, Bruno Sicard, Hai Bin Zheng, Garo Khanarian
Proceedings Volume 5212, (2003) https://doi.org/10.1117/12.508142
KEYWORDS: Waveguides, Silicon, Optical interconnects, Lithography, Planar waveguides, Refractive index, Polymers, Scattering, Thermography, Birefringence

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