KEYWORDS: Defect detection, Detection and tracking algorithms, Target detection, Small targets, Feature extraction, Education and training, Deep learning, Data modeling
At present, SMT defects have problems such as dense distribution of small components and similar and overlapping characteristics among defects, which lead to low accuracy of defect detection. It is proposed to use CS-YOLO defect detection algorithm to improve the SMT detection accuracy. Firstly, based on the YOLOv5 model, the SPD-Conv module is used to enhance the extraction ability of pixel feature information in the pooling process; secondly, the CBAM module retains important feature information from channel attention and spatial attention to improve the perception ability of the model to represent different degrees of features; the MPDIoU is used to calculate the loss function, reduce the distance between the target box and the detection box and reduce influences of additional redundant information, and to improve the efficient positioning and classification of small target positions. Finally, the experimental data show that the mAP, recall rate and accuracy of the algorithm are somewhat improved compared with the original algorithm, and they are deployed in the actual PCB production process. This algorithm significantly enhances the performance and detection rate of SMT small targets, demonstrating its effectiveness.
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