Dr. Hod Finkelstein
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 7 May 2013 Paper
Proceedings Volume 8781, 87810W (2013) https://doi.org/10.1117/12.2018890
KEYWORDS: Waveguides, Silica, Cladding, Silicon, Reflectors, Metals, Refractive index, Tolerancing, Oxides, Optical design

Proceedings Article | 25 September 2007 Paper
Hod Finkelstein, Kai Zhao, Matthias Gross, Yu-Hwa Lo, Sadik Esener
Proceedings Volume 6710, 671014 (2007) https://doi.org/10.1117/12.728822
KEYWORDS: Photons, Silicon, Upconversion, Electrons, Sensors, Infrared radiation, Luminescence, Electroluminescence, Capacitance, Avalanche photodiodes

Proceedings Article | 3 November 2006 Paper
Proceedings Volume 6372, 63720W (2006) https://doi.org/10.1117/12.705259
KEYWORDS: CMOS technology, Capacitance, Diodes, Avalanche photodiodes, Manufacturing, Silicon, Imaging systems, Sensors, Resistors, Avalanche photodetectors

Proceedings Article | 7 September 1998 Paper
Hod Finkelstein, Ran Ginosar
Proceedings Volume 3410, (1998) https://doi.org/10.1117/12.324019
KEYWORDS: Sensors, Metals, Capacitors, Charge-coupled devices, Oxides, Signal detection, Capacitance, Semiconductors, Amplifiers, CCD cameras

Proceedings Article | 1 April 1998 Paper
Hod Finkelstein, Ran Ginosar
Proceedings Volume 3301, (1998) https://doi.org/10.1117/12.304562
KEYWORDS: Sensors, Metals, Capacitors, Charge-coupled devices, Oxides, Signal detection, Capacitance, Semiconductors, Amplifiers, CCD cameras

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top