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Hanshuang Liang
at Motorola Solutions Inc
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Publications (1)
Proceedings Article | 4 September 1998 Paper
Improving manufacturability of an rf graded channel CMOS process for wireless applications
Daniel Lamey, Troy Mackie, Han-Bin Liang, Jun Ma, Georges Robert, Craig Jasper, David Ngo, Ken Papworth, Sunny Cheng, Christy Wilcock, Rosemary Gurrola, Edward Spears, Bruce Yeung
Proceedings Volume 3506, (1998) https://doi.org/10.1117/12.323961
KEYWORDS: Semiconducting wafers, Transistors, Manufacturing, Standards development, Optical alignment, CMOS technology, Tolerancing, Control systems, Diffusion, Electrodes
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