Dr. Hannes Hempel Profile

Dr. Hannes Hempel

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Proceedings Article | 9 March 2024 Presentation

Interlaboratory and NIST terahertz standards comparisons with application to non-contact semiconductor carrier measurements

Edwin Heilweil, Hannes Hempel, Timothy Magnanelli, Jared Wahlstrand, Steven Robey, Daniel Harrington, Christine McGinn, Christina Hacker

Proceedings Volume PC12884, PC128840G (2024) https://doi.org/10.1117/12.3001151

KEYWORDS: Semiconductors, Ultrafast phenomena, Silicon, Ultrafast measurement systems, Transition metals, Statistical analysis, Polymers, Perovskite, Multilayers, Monolayers

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