Dr. Haesung Park
at SAMSUNG Display Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 April 2023 Presentation + Paper
Proceedings Volume 12496, 124961H (2023) https://doi.org/10.1117/12.2658638
KEYWORDS: Semiconductor manufacturing, Inspection, Image classification, Scanning electron microscopy, Deep learning, Semiconductors, Classification systems

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top