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Gyu-sung Lim
at Kunsan National Univ
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Publications (1)
Proceedings Article | 14 November 2002 Paper
Optimum scaling theory to minimize the roll-off of threshold voltage for nanoscale MOSFET
Gyu-sung Lim, Suk-woong Ko, Jae-hong Kim, Jong-in Lee, Hak-kee Jung
Proceedings Volume 4935, (2002) https://doi.org/10.1117/12.469074
KEYWORDS: Field effect transistors, Oxides, Doping, Capacitance, Interfaces, Dielectrics, Semiconductors, Silicon, Integrated circuits, Smart structures
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