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Dr. Francis Balestra
at IMEP-LAHC
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 12 May 2003 Open Access Paper
An overview of low-frequency noise in advanced CMOS/SOI transistors
Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.487717
KEYWORDS: Transistors, Oxides, Field effect transistors, CMOS technology, Analog electronics, Silicon, Molybdenum, Silicon films, Interference (communication), Information operations
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Conference Committee Involvement (3)
Noise in Devices and Circuits III
24 May 2005 | Austin, Texas, United States
Noise in Devices and Circuits II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise in Devices and Circuits
2 June 2003 | Santa Fe, New Mexico, United States
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