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Erik Klaas
Cofounder & CTO
SPIE Involvement:
Author
Area of Expertise:
optical metrology , 3d measurement , 3d image processing , fringe projection , white light scanner , topometry
Websites:
Company Website
Publications (2)
Proceedings Article | 27 January 2011 Paper
The impact of different alignment strategies on the overall performance of a white light scanner according to sphere spacing error specified in VDI 2634
Erik Klaas, Johannes Kropp, Bill Mongon
Proceedings Volume 7864, 78640B (2011) https://doi.org/10.1117/12.876643
KEYWORDS: Scanners, Optical spheres, Cameras, Calibration, Robots, Sensors, 3D modeling, 3D scanning, Ceramics, Projection systems
Proceedings Article | 25 September 1997 Paper
3D-metrologies for industrial applications
Bernd Breuckmann, Frank Halbauer, Erik Klaas, Michael Kube
Proceedings Volume 3102, (1997) https://doi.org/10.1117/12.281314
KEYWORDS: Calibration, Cameras, Sensors, Imaging systems, Fringe analysis, Projection systems, Photogrammetry, Metrology, System integration, Data acquisition
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