Dr. Eric Robert Profile

Dr. Eric Robert

at Univ d'Orleans

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 1 August 2003 Paper

X-ray diagnostics of the near injector zone of cryogenic nitrogen jets at supercritical pressures

Brice Metay, Eric Robert, Raymond Viladrosa, Christophe Cachoncinlle, Jean-Michel Pouvesle, W. Mayer, G. Schneider

Proceedings Volume 4948, (2003) https://doi.org/10.1117/12.516896

KEYWORDS: X-rays, Nitrogen, Radiography, Cryogenics, Diagnostics, Liquids, Cameras, X-ray imaging, X-ray sources, Combustion

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Proceedings Article | 1 August 2003 Paper

Experimental study and development of a single-focus-burst x-ray flash

Moulay Idrissi, Raymond Viladrosa, Eric Robert, Christophe Cachoncinlle, Jean-Michel Pouvesle

Proceedings Volume 4948, (2003) https://doi.org/10.1117/12.516900

KEYWORDS: X-rays, Radiography, Fluctuations and noise, Power supplies, Capacitors, Switches, Fast packet switching, X-ray sources, Control systems, Diodes

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Proceedings Article | 16 June 2003 Paper

Development of a 10-kHz capillary discharge EUV lamp

Ouassima Sarroukh, Eric Robert, Thierry Gonthiez, Raymond Viladrosa, Moulay Idrissi, Claude Fleurier, Jean-Michel Pouvesle, Christophe Cachoncille

Proceedings Volume 5037, (2003) https://doi.org/10.1117/12.482330

KEYWORDS: Extreme ultraviolet, Capillaries, Lamps, Extreme ultraviolet lithography, Power supplies, Plasma, Metrology, Xenon, Mirrors, Lithography

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Proceedings Article | 1 July 2002 Paper

CAPELLA: a kHz and low-debris capillary discharge EUV source

Eric Robert, Thierry Gonthiez, O. Sarroukh, A. Thomann, Raymond Viladrosa, Claude Fleurier, Jean-Michel Pouvesle, Christophe Cachoncinlle

Proceedings Volume 4688, (2002) https://doi.org/10.1117/12.472276

KEYWORDS: Extreme ultraviolet, Capillaries, Semiconducting wafers, Silicon, Extreme ultraviolet lithography, Plasma, Photodiodes, Xenon, Mirrors, Power supplies

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Proceedings Article | 20 August 2001 Paper

Spectroscopic and energetic investigation of capillary discharges devoted to EUV production for new lithography generation

Eric Robert, Branimir Blagojevic, Remi Dussart, Smruti Mohanty, Moulay Idrissi, Dunpin Hong, Raymond Viladrosa, Jean-Michel Pouvesle, Claude Fleurier, Christophe Cachoncinlle

Proceedings Volume 4343, (2001) https://doi.org/10.1117/12.436689

KEYWORDS: Capillaries, Extreme ultraviolet, Xenon, Plasma, Inductance, Capacitors, Spectroscopy, Krypton, Capacitance, Extreme ultraviolet lithography

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Proceedings Article | 17 April 2001 Paper

Spray and gaseous jet diagnostics using x-ray-induced fluorescence imaging and flash radiography

Laurent Hure, Eric Robert, Christophe Cachoncinlle, Raymond Viladrosa, Jean-Michel Pouvesle, Y. Michou, Iskender Gokalp

Proceedings Volume 4183, (2001) https://doi.org/10.1117/12.424318

KEYWORDS: X-rays, Radiography, Luminescence, Argon, X-ray fluorescence spectroscopy, X-ray imaging, Diagnostics, Photons, Iron, Sensors

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Proceedings Article | 24 April 2000 Paper

Comparative study of x-ray-flash-, e-beam-, and ion-beam-induced molecular ion continua fluorescence of rare gases

Eric Robert, Christophe Cachoncinlle, Jean-Michel Pouvesle, Andrei Fedenev, Victor Tarasenko, Jochen Wieser, Andreas Ulrich

Proceedings Volume 4071, (2000) https://doi.org/10.1117/12.383462

KEYWORDS: Argon, Luminescence, X-rays, Krypton, Roentgenium, Ion beams, Ions, Plasma, Gases, X-ray fluorescence spectroscopy

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Showing 5 of 7 publications

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