Dong-Sik Shim
at SAMSUNG Advanced Institute of Technology
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 5 March 2022 Presentation + Paper
Dongjae Shin, Inoh Hwang, Eunkyung Lee, Changgyun Shin, Jisan Lee, Hyunil Byun, Dongshik Shim, Bongyong Jang, Changbum Lee, Kyunghyun Son, Tatsuhiro Otsuka, Hyuck Choo, Kyoungho Ha
Proceedings Volume 12007, 1200708 (2022) https://doi.org/10.1117/12.2610860
KEYWORDS: LIDAR, Silicon, Silicon photonics, Photonic integrated circuits, Sensors

Proceedings Article | 13 March 2013 Paper
Dongsik Shim, Woonbae Kim, Hyung Choi
Proceedings Volume 8616, 86160J (2013) https://doi.org/10.1117/12.2002262
KEYWORDS: Electrodes, Switches, LCDs, Optical switching, Glasses, Aluminum, Microelectromechanical systems, Optical lithography, Surface micromachining, Plasma etching

Proceedings Article | 11 October 2012 Paper
Proceedings Volume 8475, 84750L (2012) https://doi.org/10.1117/12.929393
KEYWORDS: Electrodes, Optical switching, Microelectromechanical systems, Switches, LCDs, Iron, Laser Doppler velocimetry, Glasses, Aluminum, Metals

Proceedings Article | 19 November 2001 Paper
Jong-Woo Shin, Seok-Whan Chung, Dong-Sik Shim, Hyungjae Shin, Byeong Cheon Koh
Proceedings Volume 4593, (2001) https://doi.org/10.1117/12.448857
KEYWORDS: Aluminum, Diagnostics, Thin films, Sputter deposition, Silicon films, Microelectromechanical systems, Semiconducting wafers, Argon, Temperature metrology, Titanium

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