Dr. Dirk Stenkamp
Managing Director/Board Member at Carl Zeiss SMT AG
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 August 2001 Paper
Dirk Stenkamp, O. Kienzle, Alexander Orchowski, Wigbert Rau, A. Weickenmeier, G. Benner, M. Wetzke, Warren Waskiewicz, Victor Katsap, Xieqing Zhu, Haoning Liu, Eric Munro, John Rouse
Proceedings Volume 4343, (2001) https://doi.org/10.1117/12.436642
KEYWORDS: Charged-particle lithography, Photomasks, Optics manufacturing, Projection systems, Optical alignment, Metrology, Semiconducting wafers, Electron beam lithography, Projection lithography, Lithography

Proceedings Article | 26 April 2001 Paper
Dirk Stenkamp, Claudia Hertfelder, O. Kienzle, Alexander Orchowski, Wigbert Rau, A. Weickenmeier, Warren Waskiewicz
Proceedings Volume 4404, (2001) https://doi.org/10.1117/12.425222
KEYWORDS: Charged-particle lithography, Optics manufacturing, Photomasks, Projection systems, Metrology, Optical alignment, Semiconducting wafers, Monochromatic aberrations, Wafer-level optics, Lithography

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