David M. Roper
at Univ of Toronto
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 March 2017 Presentation + Paper
Proceedings Volume 10094, 100940T (2017) https://doi.org/10.1117/12.2256995
KEYWORDS: Femtosecond phenomena, Laser processing, Thin films, Interferometry, Interfaces, Visibility, Polarization, Silicon, Reflection, Silicon films

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