David Ober
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 June 2023 Presentation
Proceedings Volume 12537, 1253707 (2023) https://doi.org/10.1117/12.2667837
KEYWORDS: LIDAR, 3D modeling, System identification, Point clouds, Modeling, Error analysis, 3D acquisition, Distortion, Diffraction limit, 3D metrology

Conference Committee Involvement (1)
3D Imaging Metrology
19 January 2009 | San Jose, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top