Dave J. Costello
CTO at Senspex Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 May 2010 Paper
Edward Gillman, Alexander Raspopin, David Costello, Miguel Moreno, Richard Kasica
Proceedings Volume 7679, 76791T (2010) https://doi.org/10.1117/12.849577
KEYWORDS: Waveguides, Semiconducting wafers, Scanning electron microscopy, Planar waveguides, Silica, Polymers, Refractive index, Polymer thin films, Coating, Titanium dioxide

Proceedings Article | 12 May 2009 Paper
Edward Gillman, Alexander Raspopin, David Costello, Miguel Moreno, Andrew Taylor
Proceedings Volume 7318, 731812 (2009) https://doi.org/10.1117/12.819794
KEYWORDS: Nanostructures, Semiconducting wafers, Gold, Sensors, Electron beam lithography, Molecules, Nanosensors, Confocal microscopy, Lithography, Nanolithography

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