Dr. Craig P. Allford Profile

Dr. Craig P. Allford

at Cardiff University

SPIE Involvement:

Author

Publications (12)

Proceedings Article | 13 March 2024 Presentation

Presentation

Effect of Ge-substrate thickness on 940-nm VCSEL performance

Sara-Jayne Gillgrass, Craig Allford, Jack Baker, Andrew Johnson, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12904, PC1290408 (2024) https://doi.org/10.1117/12.3001658

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Manufacturing, Reliability, Photovoltaics, Industry, High volume manufacturing, Gallium arsenide, Fabrication, Chip manufacturing

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Proceedings Article | 13 March 2024 Presentation

Presentation

InAs quantum dot-based one- and two-port multimode interference reflectors for integrated photonic devices: design, fabrication, and evaluation

Fwoziah Albeladi, Sara-Jayne Gillgrass, Josie Travers-Nabialek, Pawan Mishra, Richard Forrest, Craig Allford, Tahani Albiladi, Samuel Shutts, Peter Smowton

Proceedings Volume PC12905, PC129050G (2024) https://doi.org/10.1117/12.3003224

KEYWORDS: Reflectors, Quantum interference, Quantum devices, Integrated photonics, Fabrication, Multimode interference devices, Indium arsenide, Design and modelling, Mirrors, Quantum ground state

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Proceedings Article | 17 March 2023 Presentation

Presentation

Evaluation of 1.3-μm-region emitting InAs QD edge-emitting lasers over 150-mm substrates

Sara-Jayne Gillgrass, Craig Allford, Mukul Debnath, Andrew Clark, Peter Smowton

Proceedings Volume PC12440, PC1244002 (2023) https://doi.org/10.1117/12.2646136

KEYWORDS: Indium arsenide, Semiconducting wafers, Laser applications, Ultrafast phenomena, Tunable lasers, Tolerancing, Three dimensional sensing, Silicon, Semiconductor lasers, Quantum dot lasers

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Proceedings Article | 17 March 2023 Presentation

Presentation

Characterisation of 200 mm GaAs and Ge substrate VCSELs for high-volume manufacturing

Sara-Jayne Gillgrass, Craig Allford, Andrew Johnson, Jack Baker, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12439, PC124390B (2023) https://doi.org/10.1117/12.2648442

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, High volume manufacturing, Manufacturing, Gallium arsenide, Germanium, Three dimensional sensing, Reliability, Crystals

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Proceedings Article | 17 March 2023 Presentation

Presentation

Quick fabrication VCSEL characterisation for rapid assessment of epitaxy design and growth

Craig Allford, Jack Baker, Sara-Jayne Gillgrass, James Meiklejohn, Denise Powell, Wyn Meredith, Tracy Sweet, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12439, PC124390C (2023) https://doi.org/10.1117/12.2648742

KEYWORDS: Vertical cavity surface emitting lasers, Epitaxy, Semiconducting wafers, Wavelength tuning, Wafer-level optics, Temperature metrology, Structural design, Spectrographs, Oxidation, Integrating spheres

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Proceedings Article | 17 March 2023 Presentation

Presentation

InAs quantum dots emitting in C and L-wavelength band

Samuel Shutts, Zhongming Cao, Bogdan Ratiu, Oumaima Abouzaid, Maryam Alsayyadi, Josie Nabialek, Ben Salmond, Harry Gordon-Moys, Craig Allford, Sara-Jayne Gillgrass, Qiang Li, Peter Smowton

Proceedings Volume PC12440, PC1244003 (2023) https://doi.org/10.1117/12.2656101

KEYWORDS: Indium arsenide, Quantum dots, Temperature metrology, Silicon, Semiconductor lasers, Hybrid silicon lasers, Target detection, Pulsed laser operation, Methane, Metalorganic chemical vapor deposition

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Proceedings Article | 17 March 2023 Presentation

Presentation

1.3-μm InAs QD lasers for integrated photonics

Lydia Jarvis, Ben Maglio, Sara Gillgrass, Craig Allford, Fwoziah Albeladi, Abigail Enderson, Sam Shutts, Huiwen Deng, Mingchu Tang, Huiyun Liu, Peter Smowton

Proceedings Volume PC12440, PC1244001 (2023) https://doi.org/10.1117/12.2656077

KEYWORDS: Integrated photonics, Indium arsenide, Quantum dots, Quantum dot lasers, Modulation, Laser damage threshold, Tolerancing, Silicon, Semiconductor lasers

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Proceedings Article | 17 March 2023 Presentation

Presentation

Design and characterisation of VCSELs for atomic sensor applications

Samuel Shutts, Curtis Hentschel, Sara-Jayne Gillgrass, James Meiklejohn, Craig Allford, Jack Baker, Josie Nabialek, Denise Powell, Witold Chalupczak, Mohsin Haji, Wyn Meredith, Peter Smowton

Proceedings Volume PC12439, PC1243907 (2023) https://doi.org/10.1117/12.2650495

KEYWORDS: Vertical cavity surface emitting lasers, Sensors, Quantum wells, Optical pumping, Ytterbium, Temperature metrology, Strontium, Mirrors, Second-harmonic generation, Spectroscopes

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Proceedings Article | 25 May 2022 Presentation

Presentation

Impact of strain-induced bow on the performance of VCSELs on 150mm GaAs- and Ge-substrate wafers

Jack Baker, Sara Gillgrass, Tomas Peach, Craig Allford, J. Iwan Davies, Andrew Johnson, Andrew Joel, Sung Wook Lim, Samuel Shutts, Peter Smowton

Proceedings Volume PC12141, PC1214108 (2022) https://doi.org/10.1117/12.2624492

KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Gallium arsenide, Germanium, Oxides, Oxidation, Manufacturing, Surface finishing, Statistical analysis, Polishing

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Proceedings Article | 9 March 2022 Presentation

Presentation

Sub-mA threshold current quick fabrication VCSELs for characterisation of epitaxial material over 150mm wafers

Jack Baker, Craig Allford, Sara Gillgrass, Tomas Peach, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume PC12020, PC1202007 (2022) https://doi.org/10.1117/12.2610179

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Measurement devices, Reflectometry, Oxides, Oxidation, Bridges

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Proceedings Article | 5 March 2021 Presentation

Presentation

Quick fabrication of 940nm emitting VCSEL arrays for commercial wafer characterization

Jack Baker, David Hayes, Tomas Peach, Sara Gillgrass, Craig Allford, Curtis Hentschel, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Clive Meaton, Aidan Daly, Tracy Sweet, Iwan Davies, Samuel Shutts, Peter Smowton

Proceedings Volume 11704, 1170408 (2021) https://doi.org/10.1117/12.2578365

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Thermal oxidation, Manufacturing, Calibration

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Proceedings Article | 5 March 2021 Presentation

Presentation

150mm full wafer fabrication and characterization of 940nm emitting VCSELs for high-volume manufacture

David Hayes, Tomas Peach, Jack Baker, Sara-Jayne Gillgrass, Craig Allford, Angela Sobiesierski, Connie Eng, Saleem Shabbir, Stuart Thomas, Curtis Hentschel, Clive Meaton, Samuel Shutts, Aidan Daly, Tracy Sweet, Iwan Davies, Peter Smowton

Proceedings Volume 11704, 1170406 (2021) https://doi.org/10.1117/12.2578592

KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Manufacturing, Wafer testing, Thermal oxidation, Reflectivity, Photoresist materials, Oxides, Electro optics, Analytical research

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Showing 5 of 12 publications

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