CONFERENCE PROCEEDINGS
Advanced Search
Chieh-Hsi Lin
at Univ of Illinois
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 3 March 2022 Poster + Paper
Epidermal thickness measurement on skin OCT using time-efficient deep learning with graph search
Proceedings Volume 11934, 119340G (2022) https://doi.org/10.1117/12.2613041
KEYWORDS: Image segmentation, Optical coherence tomography, Skin, Error analysis, Visualization, Performance modeling, Visual process modeling, Image processing algorithms and systems, Dermatology, Skin cancer
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top