Dr. Chandan Sharma
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 March 2022 Presentation + Paper
Proceedings Volume 12001, 120010D (2022) https://doi.org/10.1117/12.2609666
KEYWORDS: Field effect transistors, Electrons, Reliability, Doping, Gallium nitride, Iron, Carbon, Device simulation, Amplifiers, Physics

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