Dr. Bing Ye
at Hefei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 January 2008 Paper
Bing Ye, Yi Hu
Proceedings Volume 6829, 68291M (2008) https://doi.org/10.1117/12.757257
KEYWORDS: 3D metrology, 3D image processing, Image processing, Feature extraction, Optical testing, 3D modeling, CCD image sensors, 3D acquisition, 3D image reconstruction, Optical scanning

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