Argho Das
at imec
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 31 October 2022 Poster
Proceedings Volume PC12292, PC122920Z (2022) https://doi.org/10.1117/12.2645403
KEYWORDS: Scanning electron microscopy, Semiconductors, Data modeling, Photomasks, Metrology, Calibration, Wafer-level optics, Stochastic processes, Shape analysis, Semiconducting wafers

Proceedings Article | 12 October 2021 Poster + Presentation + Paper
Proceedings Volume 11854, 1185418 (2021) https://doi.org/10.1117/12.2600938
KEYWORDS: Etching, Logic, Critical dimension metrology, Inspection, Extreme ultraviolet lithography, Semiconducting wafers, Electron beam lithography, Optical lithography, Metrology, Diffractive optical elements

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top