Aaron T. Cannistra
Systems Engineer
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 14 February 2011 Paper
Proceedings Volume 7927, 79270Y (2011) https://doi.org/10.1117/12.876280
KEYWORDS: Optical filters, Semiconducting wafers, Fabrication, Dielectrics, Lithography, Composites, Dielectric filters, Silica, Polymers, Sensors

SPIE Journal Paper | 1 January 2010
JM3, Vol. 9, Issue 01, 013025, (January 2010) https://doi.org/10.1117/12.10.1117/1.3293969
KEYWORDS: Lithography, Semiconducting wafers, Micro optics, Refractive index, Polymers, Photoresist processing, Microlens, Silicon, Photomasks, Optical lithography

Proceedings Article | 24 February 2009 Paper
Proceedings Volume 7205, 720517 (2009) https://doi.org/10.1117/12.813463
KEYWORDS: Lithography, Semiconducting wafers, Polymers, Refractive index, Micro optics, Lenses, Photomasks, Photoresist materials, Etching, Silicon

Proceedings Article | 6 February 2008 Paper
Proceedings Volume 6883, 68830C (2008) https://doi.org/10.1117/12.769694
KEYWORDS: Semiconducting wafers, Micro optics, Lithography, Polymers, Etching, Optical lithography, Microlens array, Silicon, Resistance, Microlens

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