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7 December 2023 Three-dimensional aerial images of periodic patterns and the depth of focus for lines-and-spaces patterns (Erratum)
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Abstract

Erratum corrects several errors in mathematical expressions.

This article [J. Micro/Nanopattern. Mater. Metrol., 22(2) 020501 (2023) doi: 10.1117/1.JMM.22.2.020501] was originally published 18 May 2023 with several errors.

On page 3, the sentence “Hence, the β-dependence can be safely neglected and the effect of the illuminating line is almost the same as that of an illuminating point located at intersection of the dashed line and the x-axis in Fig. 2” has been corrected to “Hence, the β-dependence under the square root in Eq. (7) can be safely neglected and the effect of the illuminating line is almost the same as that of an illuminating point located at intersection of the dashed line and the x-axis in Fig. 2.”

On page 4, the following sentence contained an error in a denominator: “The most optimal outcome is obtained by setting sinδ=λ/(2p)=sinδ0; one then sees that ϕz(sinδ0)=0 and an image Ii(x,z;δ0)=A2+B2+2ABcos[2πxp+(ϕAϕB)] that is independent of z.” The expression 2πxλ has been corrected to 2πxp.

The article was corrected 28 November 2023.

© 2023 Society of Photo-Optical Instrumentation Engineers (SPIE)
Anthony Yen "Three-dimensional aerial images of periodic patterns and the depth of focus for lines-and-spaces patterns (Erratum)," Journal of Micro/Nanopatterning, Materials, and Metrology 22(4), 049801 (7 December 2023). https://doi.org/10.1117/1.JMM.22.4.049801
Published: 7 December 2023
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KEYWORDS
3D image processing

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