Characterization of far field of diode laser by three dimensional measurement

Hui Liu; Zhiyuan Yuan; Long Cui; Di Wu; Xingsheng Liu

doi:10.1117/12.2076548

26 February 2015 Characterization of far field of diode laser by three dimensional measurement

Hui Liu, Zhiyuan Yuan, Long Cui, Di Wu, Xingsheng Liu

Proceedings Volume 9346, Components and Packaging for Laser Systems; 93461A (2015) https://doi.org/10.1117/12.2076548
Event: SPIE LASE, 2015, San Francisco, California, United States

Abstract

In this paper three dimensional characterization of the far field of diode laser beam is proposed. Both the divergence angle and intensity distribution can be extracted and analyzed from the measurement results with obliquity factor correction and power transmission correction. The instrument provides high resolution and fast measurement.

Citation Download Citation

Hui Liu, Zhiyuan Yuan, Long Cui, Di Wu, and Xingsheng Liu "Characterization of far field of diode laser by three dimensional measurement", Proc. SPIE 9346, Components and Packaging for Laser Systems, 93461A (26 February 2015); https://doi.org/10.1117/12.2076548

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