Paper
22 October 2010 Study on optical properties of two-color microbolometers
Henan Zhao, Tao Wang, He Yu, Chao Chen, Yadong Jiang
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Abstract
In this article, the practical structure of two-color microbolometers for uncooled infrared detection was considered, a mathematical model to calculate infrared absorptance was described. The optical characteristic of multilayer structure consisting of Nitride (SiNx) infrared absorber film/ Vanadium (VOx) heat sensitive film/ SiNx support film/ the first optical resonant cavity/ a tunable reflecting Al micromirror/ the second optical resonant cavity /a bottom electrode made up of Al was investigated. According to optical admittance matrix theory, relation between infrared absorber film thickness, the first optical resonant cavity of two-color microbolometer and infrared absorptivity was simulated by MATLAB software.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Henan Zhao, Tao Wang, He Yu, Chao Chen, and Yadong Jiang "Study on optical properties of two-color microbolometers", Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76585A (22 October 2010); https://doi.org/10.1117/12.866319
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KEYWORDS
Infrared radiation

Microbolometers

Absorption

Aluminum

Multilayers

Silicon

Thermal modeling

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