Henan Zhao
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 October 2010 Paper
Henan Zhao, Tao Wang, He Yu, Chao Chen, Yadong Jiang
Proceedings Volume 7658, 76585A (2010) https://doi.org/10.1117/12.866319
KEYWORDS: Infrared radiation, Microbolometers, Absorption, Aluminum, Multilayers, Thermal modeling, Silicon, Optical properties, Infrared detectors, MATLAB

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