Paper
17 August 2004 Digital holographic microscope for thermal characterization of silicon microhotplates for gas sensor
Giuseppe Coppola, Sergio De Nicola, Pietro Ferraro, Andrea Finizio, Piera Maccagnani, Giovanni Pierattini
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Abstract
Digital Holographic Microscope has been employed to obtain an accurate characterization of a micro-hotplate for gas sensing applications. The fabrication of these sensors needs different materials, with different properties and different technological processes, which involve high temperature treatments. Consequently, the structure is affected by the presence of residual stresses, appearing in form of undesired bowing of the membrane. Moreover, when the temperature of the sensor increases, a further warpage of the structure is observed. DHM allows to evaluate, with high accuracy, deformations due to the residual stress and how these deformations are affected by thermal loads. In particular, profiles of the structure have been evaluated both in quasi-static condition and the profile variation due to the biasing of the heater resistor has been measured.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giuseppe Coppola, Sergio De Nicola, Pietro Ferraro, Andrea Finizio, Piera Maccagnani, and Giovanni Pierattini "Digital holographic microscope for thermal characterization of silicon microhotplates for gas sensor", Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); https://doi.org/10.1117/12.546016
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KEYWORDS
Digital holography

Holograms

3D image reconstruction

Silicon

Holography

Gas sensors

Microscopes

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