Paper
16 September 2003 Understanding the electrothermal processes involved in probe storage on phase-change media
Marilyn Armand, Christopher David Wright, M. M. Aziz, Semih Senkader
Author Affiliations +
Proceedings Volume 5069, Optical Data Storage 2003; (2003) https://doi.org/10.1117/12.532640
Event: Optical Data Storage 2003, 2003, Vancouver, Canada
Abstract
We have investigated the feasibility of a probe storate technique based on the interaction of a conductive tip with a phase-change (PC) medium. The electro-thermal writing process was modeled using the element method. The crystalline and the amorphous phases were taken into account as a possible initial state of the phase-change material. The analysis of the corresponding current flow and temperature distributions showed that the choice of the initial state of the PC material greatly influences the shape of the written dots, due to the important difference in the electrical properties of these two states. When introducing the kinetics of the phase-change process in the model, the simuation results indicated indeed, that the crystalline dots spread throught the thickness of the PC layer, whereas the amorphous dots are more localized at the top of the layer. One can then expect important effects on the readout process (and contrast) and the erasing mechanism, depending on the initial state of the storage medium.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marilyn Armand, Christopher David Wright, M. M. Aziz, and Semih Senkader "Understanding the electrothermal processes involved in probe storage on phase-change media", Proc. SPIE 5069, Optical Data Storage 2003, (16 September 2003); https://doi.org/10.1117/12.532640
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Cited by 4 scholarly publications.
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KEYWORDS
Crystals

Process modeling

Shape analysis

Californium

Silicon

Thin films

Data storage

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