Double effective index method and scalar beam-propagation method analysis of wavelength shift for TE and TM polarized optical fields

Won Jay Song; Byung-Ha Ahn

doi:10.1117/12.451841

25 October 2002 Double effective index method and scalar beam-propagation method analysis of wavelength shift for TE and TM polarized optical fields

Won Jay Song, Byung-Ha Ahn

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Proceedings Volume 4772, Electro-Optical System Design, Simulation, Testing, and Training; (2002) https://doi.org/10.1117/12.451841
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

We have applied the double effective index method to reduce the two-dimensional refractive index profile into the one-dimensional refractive index structure and modified the wave equations to obtain the paraxial wave equations. Then, TE and TM polarized fields in the curved single-mode planar waveguides are analyzed by using the scalar beam-propagation method employing the finite-difference method with a slab structure. The birefringence for TE and TM polarized fields in bent waveguides is calculated from the phase difference of the optical fields. The wavelength shift due to the birefringence of TE and TM polarized fields in bent waveguides is also calculated.

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Won Jay Song and Byung-Ha Ahn "Double effective index method and scalar beam-propagation method analysis of wavelength shift for TE and TM polarized optical fields", Proc. SPIE 4772, Electro-Optical System Design, Simulation, Testing, and Training, (25 October 2002); https://doi.org/10.1117/12.451841

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KEYWORDS

Waveguides

Birefringence

Refractive index

Wave propagation

Silica

Dielectric polarization

Silicon

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