E. G. Lizarraga-Medina,1 A. Oliver,2 G. V. Vázquez,3 R. Salas-Montiel,4 H. Márquez1
1Ctr. de Investigación Científica y de Educación Superior de Ensenada B.C. (Mexico) 2Univ. Nacional Autónoma de México (Mexico) 3Ctr. de Investigaciones en Óptica, A.C. (Mexico) 4Lab. de Nanotechnologie et d’Instrumentation Optique (France)
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
An analysis of the dispersion relation of SiOx submicron optical waveguides in the visible and IR spectral range is
presented. Here is considered that the refractive index (n) of SiOx can be tuned in the range from n=1.457-2 for 2>x>1,
and a film thickness from 50nm to 1000nm. Starting from the dispersion relation and the distribution of the electric field
in the waveguide; cutoff wavelength, cutoff thickness, effective refractive index, effective guide thickness and
confinement factor of a selected mode are calculated.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
E. G. Lizarraga-Medina, A. Oliver, G. V. Vázquez, R. Salas-Montiel, H. Márquez, "Design of SiOx slab optical waveguides," Proc. SPIE 9556, Nanoengineering: Fabrication, Properties, Optics, and Devices XII, 95560H (21 August 2015); https://doi.org/10.1117/12.2187121