Demonstration of a high-precision optical probe for effective sampling of solids by Raman spectroscopy

Brian J. Marquardt; Thao Le; Lloyd W. Burgess

doi:10.1117/12.447374

31 October 2001 Demonstration of a high-precision optical probe for effective sampling of solids by Raman spectroscopy

Brian J. Marquardt, Thao Le, Lloyd W. Burgess

Proceedings Volume 4469, Raman Spectroscopy and Light Scattering Technologies in Materials Science; (2001) https://doi.org/10.1117/12.447374
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

This presentation will focus on the development, optimization and use of a Raman spectroscopy immersion probe for the analysis of solid (powders, slurries, etc.) samples with emphasis on online process analysis applications. A novel high precision Raman probe for online process analysis will be described. The unique design of the Raman probe provides enhancements in measurement precision by increasing the reproducibility and accuracy of optical sampling of high solids content samples. The probe has been proven an effective sampling interface for the analysis of powders, suspensions, slurries, particles and solids. The ease of use of the Raman probe and the increased sampling precision has lead to its use in various proof of concept and online process analytical applications. These applications include dry powder-powder mixing efficiency, coating thickness measurements, solvent drying analysis, reaction monitoring and many other analytical processes. The physical and optical design of the Raman probe will be described and the applicability of the Raman probe as an online sampling tool will be demonstrated.

Citation Download Citation

Brian J. Marquardt, Thao Le, and Lloyd W. Burgess "Demonstration of a high-precision optical probe for effective sampling of solids by Raman spectroscopy", Proc. SPIE 4469, Raman Spectroscopy and Light Scattering Technologies in Materials Science, (31 October 2001); https://doi.org/10.1117/12.447374

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available