PROCEEDINGS VOLUME 3589
NONDESTRUCTIVE EVALUATION TECHNIQUES FOR AGING INFRASTRUCTURES AND MANUFACTURING | 3-5 MARCH 1999
Process Control and Sensors for Manufacturing II
Editor(s): David M. Pepper
Editor Affiliations +
IN THIS VOLUME

4 Sessions, 20 Papers, 0 Presentations, 0 Posters
Sensors  (4)
NONDESTRUCTIVE EVALUATION TECHNIQUES FOR AGING INFRASTRUCTURES AND MANUFACTURING
3-5 March 1999
Newport Beach, CA, United States
Sensors
R. Daniel Costley, Gary Boudreaux, William G. Ramsey, Jason Simpson, Clinton Menezes
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339958
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339965
Marvin B. Klein, Gerald David Bacher, Anders Grunnet-Jepsen, Daniel Wright, William E. Moerner
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339966
Emmanuel F. Lafond, Joseph P. Gerhardstein, Pierre H. Brodeur
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339967
Process Monitoring I
Stephen Dixon, Christopher Edwards, Stuart B. Palmer
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339968
Stephen Dixon, Christopher Edwards, Stuart B. Palmer
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339969
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339950
Vasundara V. Varadan, Richard D. Hollinger, Anikumar R. Tellakula, K. A. Jose, Vijay K. Varadan
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339951
Process Monitoring II
John N. Pike, Yogesh Mehrotra
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339952
Jinghui Wang, Anhua Mei
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339953
Hongan Wang, Guozhong Dai
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339954
Process Monitoring III
Joseph L. Lenhart, John H. van Zanten, Joy P. Dunkers, Carl G. Zimba, Calvin A. James, Steven K. Pollack, Richard S. Parnas
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339955
Dirk Heider, A. Graf, Bruce K. Fink, John W. Gillespie Jr.
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339956
John H. Belk, Erwin W. Baumann, Michael L. Vandernoot
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339957
Benjamin Zurn, Susan C. Mantell
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339959
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339960
Bruno F. Pouet, Emmanuel F. Lafond, Brian Pufahl, Gerald David Bacher, Pierre H. Brodeur, Marvin B. Klein
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339961
Roderick Rowland, Gareth Munger
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339962
Process Monitoring II
Anthony Chukwujekwu Okafor, Scott R. Birdsong
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339963
Anthony Chukwujekwu Okafor, Scott R. Birdsong
Proceedings Volume Process Control and Sensors for Manufacturing II, (1999) https://doi.org/10.1117/12.339964
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