Paper
13 September 1996 Productivity improvement through cycle time analysis
Javier Bonal, Luis Rios, Carlos Ortega, Santiago Aparicio, Manuel Fernandez, Maria Rosendo, Alejandro Sanchez, Sergio Malvar
Author Affiliations +
Abstract
A cycle time (CT) reduction methodology has been developed in the Lucent Technology facility (former AT&T) in Madrid, Spain. It is based on a comparison of the contribution of each process step in each technology with a target generated by a cycle time model. These targeted cycle times are obtained using capacity data of the machines processing those steps, queuing theory and theory of constrains (TOC) principles (buffers to protect bottleneck and low cycle time/inventory everywhere else). Overall efficiency equipment (OEE) like analysis is done in the machine groups with major differences between their target cycle time and real values. Comparisons between the current value of the parameters that command their capacity (process times, availability, idles, reworks, etc.) and the engineering standards are done to detect the cause of exceeding their contribution to the cycle time. Several friendly and graphical tools have been developed to track and analyze those capacity parameters. Specially important have showed to be two tools: ASAP (analysis of scheduling, arrivals and performance) and performer which analyzes interrelation problems among machines procedures and direct labor. The performer is designed for a detailed and daily analysis of an isolate machine. The extensive use of this tool by the whole labor force has demonstrated impressive results in the elimination of multiple small inefficiencies with a direct positive implications on OEE. As for ASAP, it shows the lot in process/queue for different machines at the same time. ASAP is a powerful tool to analyze the product flow management and the assigned capacity for interdependent operations like the cleaning and the oxidation/diffusion. Additional tools have been developed to track, analyze and improve the process times and the availability.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Javier Bonal, Luis Rios, Carlos Ortega, Santiago Aparicio, Manuel Fernandez, Maria Rosendo, Alejandro Sanchez, and Sergio Malvar "Productivity improvement through cycle time analysis", Proc. SPIE 2876, Process, Equipment, and Materials Control in Integrated Circuit Manufacturing II, (13 September 1996); https://doi.org/10.1117/12.250914
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Semiconducting wafers

Semiconductors

Visualization

Software development

Astatine

Databases

Diffusion

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