Paper
28 September 1994 Mechanical properties of thin films for aerospace applications
Elisabeth D. Nicholson, Charles S. James Pickles, John E. Field
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Abstract
The materials applied to infra-red window materials in the form of thin coatings for mechanical protection or for optical reasons, can often only be produced in that form. This means that characterizing the mechanical properties of these materials requires very specialized techniques. A range of such techniques have been developed at the Cavendish Laboratory for determining the thermal expansion coefficient, internal stress, thermal shock resistance, hardness, and Young's modulus as a function of temperature of such films and results from these experiments are given.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elisabeth D. Nicholson, Charles S. James Pickles, and John E. Field "Mechanical properties of thin films for aerospace applications", Proc. SPIE 2286, Window and Dome Technologies and Materials IV, (28 September 1994); https://doi.org/10.1117/12.187349
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KEYWORDS
Diamond

Silicon

Silicon films

Chemical vapor deposition

Silicon carbide

Germanium

Thin films

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