Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels

Serhiy G. Shevel; L. V. Taranenko; Vladimir L. Voznyi

doi:10.1117/12.191973

31 October 1994 Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels

Serhiy G. Shevel, L. V. Taranenko, Vladimir L. Voznyi

Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.191973
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine

Abstract

Advantages and limitations of a computer-controlled versalite modular laboratory set-up for spectroscopic diagnostics of materials developed in the Institute of Physics In Kyiv are discussed. Comparison with the options of standard optical multichannel analyzer is made. To illustrate the operation of the system the results on luminescence of direct-gap II-IV semiconductors within a wide (up to 6 orders of magnitude) range of excitation levels are presented.

Citation Download Citation

Serhiy G. Shevel, L. V. Taranenko, and Vladimir L. Voznyi "Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); https://doi.org/10.1117/12.191973

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