Paper
1 January 1992 Grazing-incidence x-ray reflectivity: studies for the AXAF Observatory
Patrick O. Slane, Daniel A. Schwartz, Leon P. Van Speybroeck, D. Jones, John H. Chappell, James W. Bilbro, Alan P. Shapiro, Sandeep D. Dave, P. Kidd, Scott C. Texter
Author Affiliations +
Abstract
The energy bandwidth and total throughput of a grazing incidence optics system is a strong function of the X-ray reflectivity of the surface coating. In support of the Advanced X-ray Astrophysics Facility (AXAF), studies are underway to evaluate and characterize the reflectivity of potential AXAF coatings. Here we report on results obtained for Au, Ir, and Ni coatings produced by electron-beam evaporation, evaporation with ion-assist, and sputtering. Effects of coating thickness and deposition angle have been evaluated at 6.4 and 8.1 keV; the highest reflectivities are those of the thinner, about 200 A vs about 700 A, coatings. While considerable variations exist, the best Ir samples have higher reflectivity than any of the Au coatings. Data results have been compared with models for theoretical reflectivity, particularly with regard to the effective density of the coatings. Independent measurements of the coating densities have been carried out for comparison with the reflectivity results.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Patrick O. Slane, Daniel A. Schwartz, Leon P. Van Speybroeck, D. Jones, John H. Chappell, James W. Bilbro, Alan P. Shapiro, Sandeep D. Dave, P. Kidd, and Scott C. Texter "Grazing-incidence x-ray reflectivity: studies for the AXAF Observatory", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); https://doi.org/10.1117/12.51223
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Coating

Reflectivity

Gold

Mirrors

X-rays

Grazing incidence

Scanning transmission electron microscopy

Back to Top