X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

A. Hornstrup; F. E. Christensen; H. W. Schnopper

doi:10.1117/12.962675

28 July 1989 X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.

A. Hornstrup, F. E. Christensen, H. W. Schnopper

Proceedings Volume 1160, X-Ray/EUV Optics for Astronomy and Microscopy; (1989) https://doi.org/10.1117/12.962675
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

We present X-ray measurements of total reflectivity and scattering from gold coated foils. The foils are two sorts of 0.3 mm thick dip-lacquered aluminum, 0.125 mm thick plastic (Upilex) and 0.5 mm thick dip-lacquered nickel. The analysis of the data show a high reflectivity for all but the plastic foil, and only small microroughness (-10A at lengthscales below -0.1 micron), evidenced by low resolution scat-tering measurements.

Citation Download Citation

A. Hornstrup, F. E. Christensen, and H. W. Schnopper "X-Ray Measurements Of Total Reflectivity And Scattering From Au-Coated Foils.", Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); https://doi.org/10.1117/12.962675

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