Christopher H. Freund
at National Measurement Institute of Australia
SPIE Involvement:
Author
Publications (6)

SPIE Journal Paper | 2 March 2012 Open Access
Bakir Babic, Chris Freund, Jan Herrmann, Malcolm Lawn, John Miles
JM3, Vol. 11, Issue 1, 011003, (March 2012) https://doi.org/10.1117/12.10.1117/1.JMM.11.1.011003
KEYWORDS: Metrology, Sensors, Atomic force microscopy, Scanning probe microscopes, Quartz, Frequency modulation, Scanning probe microscopy, Fermium, Mirrors, Interferometers

Proceedings Article | 1 June 2011 Paper
Bakir Babic, Christopher Freund, Malcolm Lawn, John Miles, Jan Herrmann
Proceedings Volume 8036, 80360P (2011) https://doi.org/10.1117/12.884567
KEYWORDS: Metrology, Sensors, Scanning probe microscopy, Atomic force microscopy, Quartz, Scanning probe microscopes, Interferometers, Mirrors, Actuators, Standards development

Proceedings Article | 3 June 2010 Paper
Malcolm Lawn, Jan Herrmann, Christopher Freund, John Miles, Malcolm Gray, Daniel Shaddock, Victoria Coleman, Asa Jämting
Proceedings Volume 7729, 77290L (2010) https://doi.org/10.1117/12.853788
KEYWORDS: Metrology, Interferometers, Mirrors, Scanning probe microscopy, Interferometry, Scanning probe microscopes, Oscillators, Heterodyning, Laser interferometry, Standards development

Proceedings Article | 11 November 1999 Paper
Proceedings Volume 3782, (1999) https://doi.org/10.1117/12.369189
KEYWORDS: Wavefronts, Antireflective coatings, Monochromatic aberrations, Distortion, Optical coatings, LIGO, Interferometers, Reflectivity, Reflection, Nanoimprint lithography

Proceedings Article | 7 September 1999 Paper
Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360073
KEYWORDS: Coating, Fizeau interferometers, Reflectivity, Reflection, Critical dimension metrology, Fringe analysis, Surface finishing, LIGO, Interfaces, Silica

Showing 5 of 6 publications
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