Prof. Yoshiyuki Uchida Profile

Prof. Yoshiyuki Uchida

at Aichi Institute of Technology

SPIE Involvement:

Author

Publications (19)

Proceedings Article | 26 November 2009 Paper

Zooming effect of three-dimensional shape measurement system using projection method

Saburo Uchida, Hao Zhu, An Kang Yang, Jing-Nan Liu, Yoshihisa Uchida

Proceedings Volume 7506, 750606 (2009) https://doi.org/10.1117/12.840317

KEYWORDS: Cameras, Imaging systems, 3D image processing, Digital cameras, 3D metrology, 3D displays, Projection systems, Image processing, Binary data, Modulators

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Proceedings Article | 25 November 2009 Paper

Blue spectral shift of P3HT organic film by KrF excimer laser ablation

Li Jiang, Xiaohui Bao, Yoshihisa Uchida, Jingnan Liu, Y. P. Kathuria, Hideo Furuhashi, Yoshiyuki Uchida

Proceedings Volume 7509, 75090F (2009) https://doi.org/10.1117/12.840322

KEYWORDS: Absorption, Laser ablation, Excimer lasers, Thin films, Polymers, Molecules, Laser therapeutics, Molecular lasers, Crystals, X-ray diffraction

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Proceedings Article | 27 January 2009 Paper

Three-dimensional whole circumference shape measurement system using optical patterns projection technique

Katsumi Tsujioka, Yoshihisa Uchida, Jing-Nan Liu, Hideo Furuhashi, Yoshiyuki Uchida

Proceedings Volume 7156, 71560C (2009) https://doi.org/10.1117/12.811845

KEYWORDS: Projection systems, 3D image processing, CCD cameras, Image processing, Liquid crystals, Imaging systems, Computing systems, Optical testing, Modulators, Cameras

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Proceedings Article | 25 August 2006 Paper

Performance of organic field effect transistor constructed with polycarbonate gate dielectric layer

Shizuyasu Ochiai, Qiang Zhang, Yoshiyuki Uchida, Asao Ohashi, Kenzo Kojima, Teruyoshi Mizutani

Proceedings Volume 6336, 63360E (2006) https://doi.org/10.1117/12.678956

KEYWORDS: Thin films, Field effect transistors, Molecules, Annealing, Dielectrics, Semiconductors, Crystals, Thin film deposition, Atomic force microscopy, Diffraction

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Proceedings Article | 25 March 2004 Paper

Morphologies and nonlinear optical characteristics of vanadylphthalocyanine thin films prepared on polycarbonate and KBr substrates

Yonglong Jin, Hideo Furuhashi, Hiroyuki Nakano, Yoshiyuki Uchida, Kenzo Kojima, Asao Ohashi, Shizuyasu Ochiai, Teruyoshi Mizutani

Proceedings Volume 5277, (2004) https://doi.org/10.1117/12.521709

KEYWORDS: Thin films, Molecules, Annealing, Scanning electron microscopy, Crystals, Polymer thin films, Polymers, Molecular interactions, Absorption, Spectroscopy

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Proceedings Article | 2 September 2003 Paper

Three-dimensional shape measurement system using optical spatial modulator and zoom camera

Katsumi Tsujioka, Jing-Nan Liu, Yoshihisa Uchida, Kazuo Hatano, Shuntaro Higa, Hideo Furuhashi, Yoshiyuki Uchida

Proceedings Volume 5253, (2003) https://doi.org/10.1117/12.521824

KEYWORDS: CCD cameras, Projection systems, CCD image sensors, Imaging systems, Liquid crystals, 3D acquisition, Modulators, Zoom lenses, 3D image processing, Image processing

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Proceedings Article | 29 August 2002 Paper

Effects of organic gas on third-order optical susceptibility and morphology of vanadyl-phthlocyanine thin films prepared on polyimide substrate

Yong Long Jin, Qin Jiang, G. Sawa, Yoshiyuki Uchida, Kenzou Kojima, Asao Ohashi, Shizuyasu Ochiai, Teruyoshi Mizutani

Proceedings Volume 4905, (2002) https://doi.org/10.1117/12.481036

KEYWORDS: Thin films, Molecules, Absorption, Molecular interactions, Crystals, Atomic force microscopy, Molecular beam epitaxy, Information operations, Nonlinear crystals, Diffusion

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Proceedings Article | 11 February 2002 Paper

High-density sampling technique using special projections of light variation patterns in three-dimensional shape identification

Katsumi Tsujioka, Hideo Furuhashi, Kazuo Hatano, Shuntaro Higa, Yoshiyuki Uchida

Proceedings Volume 4567, (2002) https://doi.org/10.1117/12.455246

KEYWORDS: 3D acquisition, Projection systems, 3D image processing, Image processing, Binary data, Liquid crystals, 3D metrology, CCD cameras, Light sources, Video

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Proceedings Article | 19 October 2001 Paper

Nonlinear optical properties and morphologies of vanadyl-phthalocyanine crystal prepared on KCl substrate

Yong Long Jin, Qin Jiang, Yasuyuki Ito, Akinori Maeda, Hideo Furuhashi, Toshio Yoshikawa, Yoshiyuki Uchida, Kenzou Kojima, Asao Ohashi, Shizuyasu Ochiai, Teruyoshi Mizutani

Proceedings Volume 4580, (2001) https://doi.org/10.1117/12.444986

KEYWORDS: Crystals, Absorption, Thin films, Molecules, Scanning electron microscopy, Nonlinear crystals, Atomic force microscopy, Thin film deposition, Annealing, Molecular beam epitaxy

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Proceedings Article | 25 September 2001 Paper

Orientation of vanadyl-phthalocyanine film prepared by molecular beam epitaxy and treated in organic gas

H. Nakano, M. Kurihara, Akinori Maeda, Hideo Furuhashi, Toshio Yoshikawa, Yoshiyuki Uchida, Kenzou Kojima, Asao Ohashi, Shizuyasu Ochiai, Teruyoshi Mizutani

Proceedings Volume 4417, (2001) https://doi.org/10.1117/12.441312

KEYWORDS: Scanning electron microscopy, Epitaxy, Crystals, Molecular beam epitaxy, Absorption, Thin films, Molecules, Nd:YAG lasers, Optical components, Crystal optics

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Proceedings Article | 25 September 2001 Paper

Rough alignment system using moire gratings for lithography

Hideo Furuhashi, Masayuki Uchida, Yoshiyuki Uchida, Vijay Chitnis

Proceedings Volume 4417, (2001) https://doi.org/10.1117/12.441354

KEYWORDS: Optical alignment, Moire patterns, Lithography, Computer simulations, Photomasks, Semiconducting wafers, Diffraction gratings, Computing systems, Photonics, Very large scale integration

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Proceedings Article | 16 November 1999 Paper

Acquiring even-striped pattern intensity in three-dimensional shape measurement system using an optical modulator

Katsumi Tsujioka, Hideo Furuhashi, Kazuo Hatano, Shuntaro Higa, Yoshiyuki Uchida

Proceedings Volume 3835, (1999) https://doi.org/10.1117/12.370264

KEYWORDS: Projection systems, 3D acquisition, Image processing, CCD cameras, 3D image processing, Liquid crystals, 3D metrology, Binary data, Light sources, Imaging systems

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Proceedings Article | 29 April 1999 Paper

Second- and third-harmonic generations of soluble vanadyl phthalocyanine doped in polymer films

H. Nakano, Akinori Maeda, Hideo Furuhashi, Toshio Yoshikawa, Yoshiyuki Uchida, Kenzou Kojima, Asao Ohashi, Shizuyasu Ochiai, M. Ieda, Teruyoshi Mizutani

Proceedings Volume 3729, (1999) https://doi.org/10.1117/12.346780

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Proceedings Article | 29 April 1999 Paper

Theoretical studies on energy loss processes in a discharge-pumped ArF excimer laser

Hideo Furuhashi, Jun Yamada, Yoshiyuki Uchida

Proceedings Volume 3729, (1999) https://doi.org/10.1117/12.346793

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Proceedings Article | 2 January 1998 Paper

Precise micromaterial processing by excimer laser ablation

Yoshiyuki Uchida, Jun Yamada, Shuntaro Higa, Yash Kathuria, Akihiko Tsuboi, Sigeo Watanabe, Niichi Hayashi, Hideo Furuhashi

Proceedings Volume 3211, (1998) https://doi.org/10.1117/12.345378

KEYWORDS: Excimer lasers, Laser ablation, High speed cameras, Streak cameras, Cameras, Combustion, Pulsed laser operation, Ultraviolet radiation, Spectral resolution, Laser systems engineering

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Proceedings Article | 26 May 1995 Paper

Photolithographic mask aligner based on modified moire technique

Rina Sharma, N. Kataria, V. Ojha, Alok Kanjilal, Ram Narain, Vijay Chitnis, Yoshiyuki Uchida

Proceedings Volume 2440, (1995) https://doi.org/10.1117/12.209319

KEYWORDS: Optical alignment, Photomasks, Semiconducting wafers, Moire patterns, Ferroelectric materials, Wafer-level optics, Lithography, X-ray lithography, Computing systems, Automatic alignment

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Proceedings Article | 8 August 1993 Paper

Mask alignment technique using phase-shifted moire signals

Rina Sharma, Gururaj Bhat, Alok Kanjilal, Ram Narain, M. Rashmi, Vijay Chitnis, Yoshiyuki Uchida

Proceedings Volume 1927, (1993) https://doi.org/10.1117/12.150452

KEYWORDS: Optical alignment, Moire patterns, Semiconducting wafers, Photomasks, Phase shifts, Diffraction gratings, Optical lithography, Computer simulations, Ferroelectric materials, Calibration

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Proceedings Article | 1 January 1991 Paper

Super-accurate positioning technique using diffracted moire signals

Yutaka Takada, Yoshiyuki Uchida, Yasuo Akao, Jun Yamada, Shuzo Hattori

Proceedings Volume 1332, (1991) https://doi.org/10.1117/12.51107

KEYWORDS: Moire patterns, Optical alignment, Automatic alignment, Optical testing, Optical inspection, X-ray lithography, Control systems, Electronics, Printing, Very large scale integration

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Proceedings Article | 1 May 1990 Paper

Projection moire alignment technique for mix and match lithographic system

Dai Sugimoto, Seiichiro Kimura, Masami Eishima, Tsutomu Nomura, Yoshiyuki Uchida, Shuzo Hattori

Proceedings Volume 1263, (1990) https://doi.org/10.1117/12.20170

KEYWORDS: Optical alignment, Moire patterns, Semiconducting wafers, Lithography, Diffraction gratings, X-rays, X-ray lithography, Aluminum, Wafer-level optics, X-ray technology

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Showing 5 of 19 publications

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