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Yinan Kong
at Univ of Adelaide
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Author
Publications (1)
Proceedings Article | 28 February 2005 Paper
Residue number system scaling schemes
Proceedings Volume 5649, (2005) https://doi.org/10.1117/12.582137
KEYWORDS: Radon, CRTs, Binary data, Computing systems, Error analysis, Electronics engineering, Digital filtering, Smart structures, Digital signal processing, Error control coding
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