Y. Qing Wei
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 November 2009 Paper
Yiqing Wei, Nansheng Liu, Xian Hu, Xiaopu Ai, Sheng Wei, Xiaorui Liu
Proceedings Volume 7513, 751308 (2009) https://doi.org/10.1117/12.838348
KEYWORDS: Fringe analysis, Raster graphics, Charge-coupled devices, Error analysis, Image processing, Photography, Sensing systems, Physics, Sensors, Structured light

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