Vít Kanclíř
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 June 2024 Presentation + Paper
Proceedings Volume 13020, 130200F (2024) https://doi.org/10.1117/12.3017415
KEYWORDS: Second harmonic generation, Thin films, Laser damage threshold, Damage detection, Defect detection

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