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Volkmar Wieser
Team Leader at Software Competence Ctr Hagenberg GmbH
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 6 March 2013 Paper
Periodicity estimation of nearly regular textures based on discrepancy norm
Gernot Stübl, Peter Haslinger, Volkmar Wieser, Josef Scharinger, Bernhard Moser
Proceedings Volume 8661, 866106 (2013) https://doi.org/10.1117/12.2002396
KEYWORDS: Signal to noise ratio, Image processing, Error analysis, Analytical research, Statistical analysis, Databases, Image registration, Matrices, Algorithm development, Inspection
SPIE Journal Paper | 9 July 2012
Combining high productivity and high performance in image processing using Single Assignment C on multi-core CPUs and many-core GPUs
Volkmar Wieser, Peter Haslinger, Filip Korzeniowski, Bernhard Moser, Clemens Grelck, Jing Guo, Robert Bernecky, Sven-Bodo Scholz
JEI, Vol. 21, Issue 2, 021116, (July 2012) https://doi.org/10.1117/12.10.1117/1.JEI.21.2.021116
KEYWORDS: Image processing, Computer programming, MATLAB, Image filtering, Anisotropic diffusion, Anisotropic filtering, Binary data, Software engineering, Computer architecture, Computer programming languages
SPIE Journal Paper | 21 May 2012
Image processing for three-dimensional scans generated by time-of-flight range cameras
JEI, Vol. 21, Issue 2, 023012, (May 2012) https://doi.org/10.1117/12.10.1117/1.JEI.21.2.023012
KEYWORDS: Cameras, Wavelets, Image processing, Anisotropic diffusion, 3D image processing, Denoising, Modulation, 3D scanning, Image segmentation, Visualization
Proceedings Article | 12 July 2011 Paper
Combining high productivity and high performance in image processing using Single Assignment C
Volkmar Wieser, Bernhard Moser, Sven-Bodo Scholz, Stephan Herhut, Jing Guo
Proceedings Volume 8000, 80000A (2011) https://doi.org/10.1117/12.890920
KEYWORDS: Image processing, Computer programming, Anisotropic diffusion, Anisotropic filtering, Image filtering, Software engineering, Computer programming languages, Field programmable gate arrays, Image classification, Image compression
Proceedings Article | 28 February 2007 Paper
High-performance surface inspection method for thin-film sensors
Volkmar Wieser, Stefan Larndorfer, Bernhard Moser
Proceedings Volume 6503, 65030A (2007) https://doi.org/10.1117/12.703561
KEYWORDS: Inspection, Sensors, Image segmentation, Thin films, Image processing, Bismuth, Image registration, Image sensors, Detection and tracking algorithms, Image resolution
Conference Committee Involvement (1)
1st DEXA Workshop on Development of Applications for Next Generation High Performance Systems (DANGHPS 2013)
2 June 2013 |
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