Ms. Veronika Putz Profile

Veronika Putz

at Johannes Kepler Univ Linz

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 10 October 2007 Paper

A ray tracing approach to inverse pattern profilometry

Veronika Putz, Bernhard Zagar

Proceedings Volume 6762, 67620I (2007) https://doi.org/10.1117/12.733944

KEYWORDS: Cameras, Projection systems, LCDs, Ray tracing, Distortion, Transform theory, Manufacturing, Quantization, Reflection, Image processing

Read Abstract +

To achieve object matched inverse patterns for the profilometric measurement of the shape of manufactured surfaces, in general at first the shape of a faultless reference object must be known. For these purposes, a separate profilometric measurement cycle employing the reference object as specimen can be executed, if a reference object of adequate quality is available. Based upon this first measurement, an object matched inverse pattern is calculated, and the shape of an arbitrary specimen can then be compared to the ideal shape of the reference object. This paper proposes an algorithm to find inverse patterns for analytically known reference objects based upon ray tracing techniques without requiring a physically existing reference. It further provides methods for the automated derivation of setup parameters for a general profilometric measurement setup.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years