Venkata Suryanarayana Kadimesetty
Chief Engineer at Samsung R&D Institute India - Bangalore
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 15 February 2021 Presentation + Paper
Proceedings Volume 11597, 115970K (2021) https://doi.org/10.1117/12.2581286
KEYWORDS: Ultrasonography, 3D metrology, Super resolution, Ovary, Diagnostics, Signal to noise ratio

SPIE Journal Paper | 2 November 2017 Open Access
JBO, Vol. 22, Issue 11, 116001, (November 2017) https://doi.org/10.1117/12.10.1117/1.JBO.22.11.116001
KEYWORDS: Signal detection, Deconvolution, Transducers, Neural networks, Photoacoustic spectroscopy, Acquisition tracking and pointing, Signal to noise ratio, Sensors, Blood vessels, Ultrasonography

Proceedings Article | 29 March 2016 Paper
Venkata Suryanarayana K., Abhishek Mitra, Srikrishnan V., Hyun Hee Jo, Anup Bidesi
Proceedings Volume 9788, 97882E (2016) https://doi.org/10.1117/12.2216704
KEYWORDS: Image segmentation, Cardiovascular magnetic resonance imaging, Magnetic resonance imaging, Cardiac imaging, Image processing, Heart, Rigid registration, Optical inspection, Visualization, Inspection, Electrocardiography, Data modeling

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