Dr. Theophilos Maltezopoulos Profile

Dr. Theophilos Maltezopoulos

at European XFEL GmbH

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 9 June 2023 Presentation + Paper

J. Laksman, F. Dietrich, J. Liu, Th. Maltezopoulos, N. Kujala, M. Planas, W. Freund, S. Francoual, J. Grünert

Proceedings Volume 12581, 1258107 (2023) https://doi.org/10.1117/12.2665732

KEYWORDS: Krypton, Diagnostics, Hard x-rays, Xenon, Spectroscopy, Photoemission spectroscopy, X-rays, Spectral resolution

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Keywords/Phrases